Interface Test Adapters
Interface Test Adapter; Interface Connector Adapter: Interface Device AKA: ITA
See Also: Test Adapters, Interface Adapters, ITA
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PXIe Avionics Interface Cards
The OmniBus II PXIe is the next-generation of Astronics' popular OmniBus product with faster I/O and processing capabilities. With the newest advanced set of MIL-STD-1553 and ARINC 429 modules, users can verify wave form compatibilities, test functions of bus shorts and opens, and—when combined with our CoPilot® software—perform lab, production and flight test verification and simulation right out of the box. Readily available as Commercial Off-The-Shelf (COTS) products, the PCIe interface is perfect for challenging simulation, test, interface, and data recording applications.
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PXIe-6591, 12.5 Gbps, 8-Channel PXI High-Speed Serial Instrument
783638-01
12.5 Gbps, 8-Channel PXI High-Speed Serial Instrument—The PXIe‑6591 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex‑7 FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe‑6591 takes advantage of FPGA multigigabit transceivers and up to eight TX and RX lanes. In addition to high-speed serial lanes, the PXIe‑6591 features digital I/O signals that support multiple logic families with per line, per cycle direction control.
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Ethernet to CAN Bus Gateway
YAV90090
• High-performance Arm Cortex-M3 MCU with 512 Kbytes Flash, 120 MHz CPU, ART Accelerator, Ethernet P/N STM32F207IEH6• USB 2.0 connector for serial data transfer (reserved for factory use)• Connections for CAN, and power supply via 4-pole Weidmüller connector• Reboot and reset of the device to factory defaults with a reset button• Plastic casing for benchtop operation• LEDs for device status and power supply• Voltage supply from 8 to 30 V
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Mini Fiber Optic, Patchcord, ITA, 36", Multimode, 62.5/125, to LC
7-415804512-036
Mini Fiber Optic, Patchcord, ITA, 36", Multimode, 62.5/125, to LC
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Mini Coax, Module, ITA, 90 Series, 76 Position
510108132
Primary mating module 510104150. (May mate with other Receiver modules, as well.)
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PXI-8360, MXI-Express Interface, PXI Remote Control Module
779501-01
MXI-Express Interface, PXI Remote Control Module—The PXI‑8360 allows you to control PXI and CompactPCI systems from your PC using a fully transparent MXI‑Express link. It is installed in a PXI chassis and uses a PCI Express‑to‑PCI bridge to interface with an installed PCI‑8360 through a copper, x1 MXI‑Express cable.
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PXI Pull-Thru Adapter, PCB, QuadraPaddle, to 100 Pin Female HDI
510140135
PXI Pull-Thru Adapter, PCB, QuadraPaddle, to 100 Pin Female HDI
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PCI Bus Interface
PCI-6713-4IP
PCI Bus Interface 3.3 / 5 Volt via PLX 9056 33/66MHz High Performance Floating-Point DSP Up to 300MHz system clock. Up to 32Mbytes of SDRAM 4.0 Mbit flash memory for bootstrap program.
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Scalable RF Interface Unit
1257A
The Astronics 1257A is a sixth-generation RFIU design with four Commercial Off-The-Shelf (COTS) options from 1U to 4U. It comes with a new easy-to-use LXI Core 2011-compliant device and new enhanced features.
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NI-6583, 200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO
781320-02
200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO—The NI-6583 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 32 single-ended and 16 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6583 can sample digital waveforms at up to 200 MHz. It includes support for selectable single-ended voltages from 1.2 to 3.3 Volts with 10 bit resolution and common LVDS voltages.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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ARINC 429 Bus Interfaces
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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PCIe Interface Accelerator Adapter
PCIe-ACC100
ADLINK’s PCIe-ACC100 is a PCIe interface accelerator adapter developed based on Intel's vRAN Dedicated Accelerator ACC100 eASIC chip. It supports 4G and 5G codec acceleration, checksum rate matching, onboard 4G ECC memory, and hybrid automatic repeat request technology (HARQ). The PCIe form factor HHHL (half-height, half-length) can meet the needs of most application scenarios.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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High Performance PCI-GPIB Interface Card
82350C
Support fast transfer speeds for high data throughput and easily attach to low-profile PCs.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Pull-Thru Adapter, Wired, TriPaddle/Mini Coax, 90 Series, for PXIe-5172
510140248
Pull-Thru Adapter, Wired, TriPaddle/Mini Coax, 90 Series, for PXIe-5172.
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PXI-8432, 2-Port, Isolated, RS232 PXI Serial Interface Module
779743-01
2-Port, Isolated, RS232 PXI Serial Interface Module - The PXI‑8432/2 is a high-performance interface for high-speed, port-to-port isolated communication with RS232 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Dual-port Isolated CAN Interface Cards
PCI-7841/cPCI-7841
The PCI-7841/cPCI-7841 is a Controller Area Network (CAN) interface card. It supports a dual-port CAN's interface that can run independently or bridged at the same time. The built-in CAN controller of this card is Philips SJA1000, which provides bus arbitration and error detection with auto correction and re-transmission function.
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PXI-8433, 2-Port, Isolated, RS485/RS422 PXI Serial Interface Module
779744-01
2-Port, Isolated, RS485/RS422 PXI Serial Interface Module - The PXI‑8433/2 is a high-performance industrial interface for high-speed, port‑to‑port isolated communication with RS485 and RS422 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. You can also select between 4‑ and 2‑wire transceiver modes for full‑ and half‑duplex communication. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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PCI-8511, 2-Port, Low‑Speed/Fault-Tolerant CAN Interface Device
780682-02
The PCI‑8511 is a fault-tolerant controller area network (CAN) interface for developing applications with the NI‑XNET driver. The PCI‑8511 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device‑driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time for processing complex models and applications.
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Network Interface Card
XMC477RC
The XMC477RC is a quad switched mezzanine card (XMC) compatible module providing a 4-channel Gigabit Ethernet Small Form Factor pluggable (SFP) interface.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
